Anglo–American Microelectronics Data 1968–69. Manufacturers by G. W. A. Dummer, J. Mackenzie Robertson

By G. W. A. Dummer, J. Mackenzie Robertson

Anglo-American Microelectronics information 1968-69, quantity : brands R-Z provides info at the gains of the layout, development and alertness of microelectronic units. The booklet discusses the gains of the layout, development and alertness of radiation built-in circuits; Raytheon built-in circuits; RCA built-in circuits; and Signetics built-in circuits. The textual content additionally describes the beneficial properties of the layout, development and alertness of Siliconix built-in circuits; Sperry built-in circuits; Sprague built-in circuits; and STC thick movie circuits. The gains of the layout, development and alertness of Stewart-Warner micro circuits; Sylvania built-in circuits; Texas tools semiconductor networks; and transitron built-in circuits also are encompassed. The publication additional tackles the beneficial properties of the layout, development and alertness of Varo hybrid movie built-in circuits; Welwyn thick movie and skinny movie resistor networks; Westinghouse built-in circuits; and Zeltex hybrid built-in circuits. Designers, dealers, and clients of microelectronic units will locate the booklet worthy.

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Anglo–American Microelectronics Data 1968–69. Manufacturers R–Z

Anglo-American Microelectronics information 1968-69, quantity : brands R-Z offers details at the gains of the layout, building and alertness of microelectronic units. The e-book discusses the gains of the layout, building and alertness of radiation built-in circuits; Raytheon built-in circuits; RCA built-in circuits; and Signetics built-in circuits.

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1 1000 hrs End Points Same as in subgroup B6 TABLE IV - GROUP C. DESIGN TESTS LTPD M A X . ACCEPTANCE NO. SUBGROUP TEST CONDITIONS C1 DC parameters Notes 1. 3 10 2 NOTES: 1. All test equipment calibrated to meet requirements of MIL-Q-9858 and MIL-C-45662. 1 2. Details of tests, conditions and limits are given in the STATIC ELECTRICAL CHARACTERISTICS Table. 3. Details of tests, conditions and limits are given in the table SWITCHING (DYNAMIC) CHARACTERISTICS. 1583 Continued RADIATION RD-209 (Contd) RADIATION INTEGRATED CIRCUIT RELIABILITY PROGRAM The Radiation Integrated Circuit Reliability Program consists of 1 0 0 % environmental screening and statistical sampling tests designed to assure performance as specified herein, and provides for continuing uniformity bility in Radiation extra cost products.

MIL-STD-19500 is met or exceeded for all diode matrices. CIRCUIT SCHEMATIC ABSOLUTE MAXIMUM RATINGS Forward Current: 100 mA Derating Above 25°C: Surge Current (100 /x sec. max): 200 mA Operating Temp, (ambient): - 55 to +125°C Total Ckt. Dissipation (still air): 450 mW Storage Temp, (ambient): Maximum ratings ara limiting values above which permanent circuit damage may occur.

ACCEPTANCE NO. | A1 Visual and mechanical Per MIL-STD-750. 10 4 1 inspection Method 2071 A2 + 2 5 ° C DC parameters Note 2 A3 + 25°C DC parameters Note 2 10 A4 + 125°C DC parameters Note 2 15 A5 - 5 5 ° C DC parameters Note 2 15 A6 -f- 25°C AC parameters Note 3 10 SUBGROUP 1 | 10 TABLE I I I - G R O U P B ENVIRONMENTAL TESTS SUBGROUP TEST SPECIFIC CONDITIONS LIMITS MIL-STD-750 METHOD LTPO SYMBOL 1 B1 Physical Dimensions See TO-84 Outline B2 MAX. MIN. UNIT 2066 MAX. ACCEPT NO. 1 End Points (Failure Criteria) B3 "0" Output Voltage Note 1.

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